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Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks
Publication:
Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks
Date
2010
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Molle, Alessandro
;
Lamagna, Luca
;
Spiga, Sabina
;
Fanciulli, Marco
;
Brammertz, Guy
;
Meuris, Marc
Journal
Thin Solid Films
Abstract
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Views
1950
since deposited on 2021-10-18
Acq. date: 2025-10-29
Citations
Metrics
Views
1950
since deposited on 2021-10-18
Acq. date: 2025-10-29
Citations