Publication:

Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

1955 since deposited on 2021-10-18
1last month
Acq. date: 2026-02-26

Citations

Statistics

Views

1955 since deposited on 2021-10-18
1last month
Acq. date: 2026-02-26

Citations