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Nitrogen profile and dielectric cap layer (Al2O3, Dy2O3, La2O3) engineering on Hf-silicate
Publication:
Nitrogen profile and dielectric cap layer (Al2O3, Dy2O3, La2O3) engineering on Hf-silicate
Date
2007
Proceedings Paper
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15420.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Hag-Ju
;
Yu, HongYu
;
Ragnarsson, Lars-Ake
;
Chang, Vincent
;
Schram, Tom
;
O'Sullivan, Barry
;
Kubicek, Stefan
;
Mitsuhashi, Riichirou
;
Akheyar, Amal
;
Van Elshocht, Sven
;
Witters, Thomas
;
Delabie, Annelies
;
Adelmann, Christoph
;
Rohr, Erika
;
Singanamalla, Raghunath
;
Chang, Shou-Zen
;
Swerts, Johan
;
Lehnen, Peer
;
De Gendt, Stefan
;
Absil, Philippe
;
Biesemans, Serge
Journal
Abstract
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1
since deposited on 2021-10-16
Acq. date: 2025-10-23
Views
1980
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Downloads
1
since deposited on 2021-10-16
Acq. date: 2025-10-23
Views
1980
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations