Publication:

Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization

Date

2023
Journal article
https://doi.org/10.1002/admi.202202016
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dc.contributor.authorSpampinato, Valentina
dc.contributor.authorShi, Yuanyuan
dc.contributor.authorSerron, Jill
dc.contributor.authorMinj, Albert
dc.contributor.authorGroven, Benjamin
dc.contributor.authorHantschel, Thomas
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorFranquet, Alexis
dc.contributor.imecauthorSpampinato, Valentina
dc.contributor.imecauthorSerron, Jill
dc.contributor.imecauthorMinj, Albert
dc.contributor.imecauthorGroven, Benjamin
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.orcidimecSpampinato, Valentina::0000-0003-3225-6740
dc.contributor.orcidimecSerron, Jill::0000-0002-9101-8139
dc.contributor.orcidimecMinj, Albert::0000-0003-0878-3276
dc.contributor.orcidimecGroven, Benjamin::0000-0002-5781-7594
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.date.accessioned2023-06-08T08:44:24Z
dc.date.available2023-01-15T03:15:19Z
dc.date.available2023-01-17T19:02:15Z
dc.date.available2023-06-08T08:44:24Z
dc.date.embargo2023-03-06
dc.date.issued2023
dc.identifier.doi10.1002/admi.202202016
dc.identifier.issn2196-7350
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40983
dc.publisherWILEY
dc.source.beginpageArt. 2202016
dc.source.endpagena
dc.source.issue7
dc.source.journalADVANCED MATERIALS INTERFACES
dc.source.numberofpages8
dc.source.volume10
dc.subject.keywords2-DIMENSIONAL MATERIALS
dc.subject.keywordsMETAL
dc.subject.keywordsTRANSISTORS
dc.subject.keywordsMONOLAYERS
dc.subject.keywordsRESOLUTION
dc.subject.keywordsGRAPHENE
dc.subject.keywordsOXYGEN
dc.title

Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization

dc.typeJournal article
dspace.entity.typePublication
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