Publication:

Gate stability of GaN-based HEMTs with p-type gate

Date

2016

Journal article

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Files

33616.pdf 2.23 MB

Author(s)

Meneghini, Matteo

;

Rossetto, Isabella

;

Rizzato, Vanessa

;

Stoffels, Steve

;

Van Hove, Marleen

;

Posthuma, Niels

;

;

;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

Journal

Electronics

Metrics

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Acq. date: 2025-12-10