Gate stability of GaN-based HEMTs with p-type gate

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Author(s)

Meneghini, Matteo

;

Rossetto, Isabella

;

Rizzato, Vanessa

;

Stoffels, Steve

;

Van Hove, Marleen

;

Posthuma, Niels

;

;

;

Decoutere, Stefaan

;

Meneghesso, Gaudenzio

;

Journal

Electronics

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1955 since deposited on 2021-10-23

Acq. date: 2025-10-23