Publication:

Enabling 3X nm DRAM: Record low leakage 0.4 nm EOT MIM capacitors with novel stack engineering

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2111 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-02-27

Citations

Statistics

Views

2111 since deposited on 2021-10-18
2last month
1last week
Acq. date: 2026-02-27

Citations