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Design consideration for Full Well Capacity and Charge Transfer efficiency of a CCD-in-CMOS imager pixel: TCAD study
Publication:
Design consideration for Full Well Capacity and Charge Transfer efficiency of a CCD-in-CMOS imager pixel: TCAD study
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Date
2024
Proceedings Paper
https://doi.org/10.1117/12.3016675
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mahato, Swaraj
;
Thijs, Steven
Journal
Proceedings of SPIE
Abstract
Description
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351
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Acq. date: 2026-02-27
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Views
351
since deposited on 2024-11-01
3
last month
3
last week
Acq. date: 2026-02-27
Citations