Publication:
Substrate noise coupling: accurate modeling for deep sub-micron technologies
Date
| dc.contributor.author | Van der Plas, Geert | |
| dc.contributor.imecauthor | Van der Plas, Geert | |
| dc.contributor.orcidimec | Van der Plas, Geert::0000-0002-4975-6672 | |
| dc.date.accessioned | 2021-10-16T06:04:03Z | |
| dc.date.available | 2021-10-16T06:04:03Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11380 | |
| dc.source.conference | Design Automation and Test in Europe Conference - DATE | |
| dc.source.conferencedate | 6/03/2005 | |
| dc.source.conferencelocation | München Germany | |
| dc.title | Substrate noise coupling: accurate modeling for deep sub-micron technologies | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |