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Exploration of etch step interactions in the dual patterning process for process modeling

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dc.contributor.authorMelvin, Lawrence
dc.contributor.authorWard, Brian
dc.contributor.authorSong, H.
dc.contributor.authorRhie, S.U.
dc.contributor.authorLucas, K.D.
dc.contributor.authorWiaux, Vincent
dc.contributor.authorVerhaegen, Staf
dc.contributor.authorMaenhoudt, Mireille
dc.contributor.imecauthorWiaux, Vincent
dc.date.accessioned2021-10-17T08:55:59Z
dc.date.available2021-10-17T08:55:59Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.issn1071-1023
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14146
dc.source.beginpage2434
dc.source.endpage2434
dc.source.issue6
dc.source.journalJournal of Vacuum Science and Technology B
dc.source.volume26
dc.title

Exploration of etch step interactions in the dual patterning process for process modeling

dc.typeJournal article
dspace.entity.typePublication
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