Publication:
Modelling negative bias temperature instabilities in advanced pMOSFETs
Date
| dc.contributor.author | Houssa, Michel | |
| dc.contributor.imecauthor | Houssa, Michel | |
| dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
| dc.date.accessioned | 2021-10-16T02:09:55Z | |
| dc.date.available | 2021-10-16T02:09:55Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10610 | |
| dc.source.beginpage | 3 | |
| dc.source.endpage | 12 | |
| dc.source.issue | 1 | |
| dc.source.journal | Microelectronic Reliability | |
| dc.source.volume | 45 | |
| dc.title | Modelling negative bias temperature instabilities in advanced pMOSFETs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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