Publication:

Automatic prediction of MOSFETs threshold voltage by machine learning algorithms

Date

2023
Proceedings Paper
https://doi.org/10.1109/EDTM55494.2023.10103059
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dc.contributor.authorChoi, Seoyeon
dc.contributor.authorPark, Dong Geun
dc.contributor.authorKim, Min Jung
dc.contributor.authorBang, Seain
dc.contributor.authorKim, Jungchun
dc.contributor.authorJin, Seunghee
dc.contributor.authorHuh, Ki Seok
dc.contributor.authorKim, Donghyun
dc.contributor.authorKim, Sanghyeok
dc.contributor.authorYoon, Inkyu
dc.contributor.authorMitard, Jerome
dc.contributor.authorHan, Cheol E.
dc.contributor.authorLee, Jae Woo
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.accessioned2023-11-29T08:53:42Z
dc.date.available2023-09-03T17:38:59Z
dc.date.available2023-11-29T08:53:42Z
dc.date.issued2023
dc.description.wosFundingTextThis research was supported by the National Research Foundation (NRF-2022R1A2C1010447, 2021R1F1A1063342), European Nanoelectronics Access (ASCENT+).
dc.identifier.doi10.1109/EDTM55494.2023.10103059
dc.identifier.eisbn979-8-3503-3252-0
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42460
dc.publisherIEEE
dc.source.conference7th IEEE Electron Devices Technology and Manufacturing Conference (EDTM)
dc.source.conferencedateMAR 07-10, 2023
dc.source.conferencelocationSeoul
dc.source.journalna
dc.source.numberofpages3
dc.title

Automatic prediction of MOSFETs threshold voltage by machine learning algorithms

dc.typeProceedings paper
dspace.entity.typePublication
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