Publication:
Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements
Date
| dc.contributor.author | Schreurs, Dominique | |
| dc.contributor.author | Verspecht, J. | |
| dc.contributor.author | Vandenberghe, S. | |
| dc.contributor.author | Carchon, Geert | |
| dc.contributor.author | van der Zanden, Koen | |
| dc.contributor.author | Nauwelaers, Bart | |
| dc.contributor.imecauthor | Schreurs, Dominique | |
| dc.contributor.imecauthor | Nauwelaers, Bart | |
| dc.date.accessioned | 2021-10-14T11:37:39Z | |
| dc.date.available | 2021-10-14T11:37:39Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3807 | |
| dc.source.beginpage | 753 | |
| dc.source.conference | Digest of the International Microwave Symposium - IEEE MTTS | |
| dc.source.conferencedate | 13/06/1999 | |
| dc.source.conferencelocation | Anaheim, CA USA | |
| dc.source.endpage | 756 | |
| dc.title | Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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