Publication:

Effects of detrapping on electron traps generated in gate oxides

Date

2003
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorZhang, W.D.
dc.contributor.authorZhang, J.F.
dc.contributor.authorLalor, M.J.
dc.contributor.authorBurton, D.R.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.date.accessioned2021-10-15T07:57:56Z
dc.date.available2021-10-15T07:57:56Z
dc.date.embargo9999-12-31
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8435
dc.source.beginpage174
dc.source.endpage182
dc.source.issue2
dc.source.journalSemiconductor Science and Technology
dc.source.volume18
dc.title

Effects of detrapping on electron traps generated in gate oxides

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
7209.pdf
Size:
197.41 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles