Publication:

IEEE International Integrated Reliability Workshop (IIRW) 2019

Date

2020
Editorial Material
https://doi.org/10.1109/TDMR.2020.2995297
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dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorChbili, Zakariae
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.date.accessioned2022-01-12T11:22:05Z
dc.date.available2021-11-02T16:07:13Z
dc.date.available2022-01-12T11:22:05Z
dc.date.issued2020
dc.identifier.doi10.1109/TDMR.2020.2995297
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38344
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage228
dc.source.endpage229
dc.source.issue2
dc.source.journalIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
dc.source.numberofpages2
dc.source.volume20
dc.title

IEEE International Integrated Reliability Workshop (IIRW) 2019

dc.typeEditorial material
dspace.entity.typePublication
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