Publication:

The impact of the temperature on In0.53Ga0.47As nTFETs

Date

2018
Journal article
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dc.contributor.authorBordallo, Caio
dc.contributor.authorMartino, J.A.
dc.contributor.authorAgopian, P.G.D.
dc.contributor.authorAlian, AliReza
dc.contributor.authorMols, Yves
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorVerhulst, Anne
dc.contributor.authorMocuta, Dan
dc.contributor.authorLin, Dennis
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorCollaert, Nadine
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-25T16:52:07Z
dc.date.available2021-10-25T16:52:07Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.issn2516-3914
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30300
dc.identifier.urlhttps://www.openscience.fr/The-impact-of-the-temperature-on-In0-53Ga0-47As-nTFETs
dc.source.issue1
dc.source.journalNanoelectronic Devices
dc.source.volume18
dc.title

The impact of the temperature on In0.53Ga0.47As nTFETs

dc.typeJournal article
dspace.entity.typePublication
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