Publication:
De-coupling Thermo-migration from Electromigration using a dedicated test structure
| dc.contributor.author | Varela Pedreira, Olalla | |
| dc.contributor.author | Ding, Youqi | |
| dc.contributor.author | Coenen, David | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | Saleh, Ahmed | |
| dc.contributor.author | Simons, Veerle | |
| dc.contributor.author | Zahedmanesh, Houman | |
| dc.contributor.author | Ciofi, Ivan | |
| dc.contributor.author | Croes, Kristof | |
| dc.contributor.imecauthor | Pedreira, O. Varela | |
| dc.contributor.imecauthor | Ding, Y. | |
| dc.contributor.imecauthor | Coenen, D. | |
| dc.contributor.imecauthor | Roussel, Ph. | |
| dc.contributor.imecauthor | Saleh, A. | |
| dc.contributor.imecauthor | Simons, V. | |
| dc.contributor.imecauthor | Zahedmanesh, H. | |
| dc.contributor.imecauthor | Ciofi, I. | |
| dc.contributor.imecauthor | Croes, K. | |
| dc.date.accessioned | 2024-08-16T18:28:03Z | |
| dc.date.available | 2024-08-16T18:28:03Z | |
| dc.date.issued | 2024 | |
| dc.identifier.doi | 10.1109/IRPS48228.2024.10529380 | |
| dc.identifier.eisbn | 979-8-3503-6976-2 | |
| dc.identifier.isbn | 979-8-3503-6977-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44312 | |
| dc.publisher | IEEE | |
| dc.source.conference | International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | 2024-04-14 | |
| dc.source.conferencelocation | Grapevine | |
| dc.source.numberofpages | 5 | |
| dc.title | De-coupling Thermo-migration from Electromigration using a dedicated test structure | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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