Publication:

De-coupling Thermo-migration from Electromigration using a dedicated test structure

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529380
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dc.contributor.authorVarela Pedreira, Olalla
dc.contributor.authorDing, Youqi
dc.contributor.authorCoenen, David
dc.contributor.authorRoussel, Philippe
dc.contributor.authorSaleh, Ahmed
dc.contributor.authorSimons, Veerle
dc.contributor.authorZahedmanesh, Houman
dc.contributor.authorCiofi, Ivan
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorPedreira, O. Varela
dc.contributor.imecauthorDing, Y.
dc.contributor.imecauthorCoenen, D.
dc.contributor.imecauthorRoussel, Ph.
dc.contributor.imecauthorSaleh, A.
dc.contributor.imecauthorSimons, V.
dc.contributor.imecauthorZahedmanesh, H.
dc.contributor.imecauthorCiofi, I.
dc.contributor.imecauthorCroes, K.
dc.date.accessioned2024-08-16T18:28:03Z
dc.date.available2024-08-16T18:28:03Z
dc.date.issued2024
dc.identifier.doi10.1109/IRPS48228.2024.10529380
dc.identifier.eisbn979-8-3503-6976-2
dc.identifier.isbn979-8-3503-6977-9
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44312
dc.publisherIEEE
dc.source.conferenceInternational Reliability Physics Symposium (IRPS)
dc.source.conferencedate2024-04-14
dc.source.conferencelocationGrapevine
dc.source.numberofpages5
dc.title

De-coupling Thermo-migration from Electromigration using a dedicated test structure

dc.typeProceedings paper
dspace.entity.typePublication
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