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Direct measurement of barrier height at the HfO2/poly-Si interface:
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Direct measurement of barrier height at the HfO2/poly-Si interface:
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Date
2004-06
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pantisano, Luigi
;
Chen, Pei Jun
;
Afanas'ev, Valeri
;
Ragnarsson, Lars-Ake
;
Pourtois, Geoffrey
;
Groeseneken, Guido
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1928
since deposited on 2021-10-15
3
last month
Acq. date: 2025-12-10
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Metrics
Views
1928
since deposited on 2021-10-15
3
last month
Acq. date: 2025-12-10
Citations