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Evaluation of novel carrier substrates for high reliability and integrated GaN devices in a 200 mm complementary metal-oxide semiconductor compatible process
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2037 since deposited on 2021-10-26
3last month
Acq. date: 2026-01-07
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Views
2037 since deposited on 2021-10-26
3last month
Acq. date: 2026-01-07
Citations