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Border trap based modeling of SiC transistor transfer characteristics
Publication:
Border trap based modeling of SiC transistor transfer characteristics
Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tyaginov, Stanislav
;
Jech, Markus
;
Rzepa, Gerhard
;
Grill, Alexander
;
El-Sayed, Al-Moatasem
;
Pobegen, Gregor
;
Makarov, Alexander
;
Grasser, Tibor
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1959
since deposited on 2021-10-26
426
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1959
since deposited on 2021-10-26
426
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations