Publication:

Wafer-Level LICCDM Device Testing

Date

2021
Proceedings Paper
https://doi.org/10.23919/EOS/ESD52038.2021.9574789
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dc.contributor.authorSimicic, Marko
dc.contributor.authorWu, Wei-Min
dc.contributor.authorClaes, Dieter
dc.contributor.authorTamura, Shinichi
dc.contributor.authorShimada, Yohei
dc.contributor.authorSawada, Masanori
dc.contributor.authorChen, Shih-Hung
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWu, Wei-Min
dc.contributor.imecauthorClaes, Dieter
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.date.accessioned2022-06-28T14:01:15Z
dc.date.available2022-05-05T02:17:41Z
dc.date.available2022-05-16T07:58:45Z
dc.date.available2022-06-28T14:01:15Z
dc.date.embargo9999-12-31
dc.date.issued2021
dc.identifier.doi10.23919/EOS/ESD52038.2021.9574789
dc.identifier.eisbn978-1-58537-329-1
dc.identifier.isbn978-1-58537-330-7
dc.identifier.issn0739-5159
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39751
dc.publisherIEEE
dc.source.conference43rd Annual EOS/ESD Symposium (EOS/ESD)
dc.source.conferencedateSEP 26-OCT 01, 2021
dc.source.conferencelocationTucson
dc.source.journalna
dc.source.numberofpages8
dc.subject.disciplineElectrical & electronic engineering
dc.title

Wafer-Level LICCDM Device Testing

dc.typeProceedings paper
dspace.entity.typePublication
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