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Study of silicon-silicon nitride interface properties on flat and textured surfaces by deep level transient spectroscopy
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Study of silicon-silicon nitride interface properties on flat and textured surfaces by deep level transient spectroscopy
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Date
2010
Proceedings Paper
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20997.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gong, Chun
;
Simoen, Eddy
;
Zhao, Lu
;
Posthuma, Niels
;
Van Kerschaver, Emmanuel
;
Poortmans, Jef
;
Mertens, Robert
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1884
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Acq. date: 2025-12-12
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Views
1884
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-12
Citations