Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Presentations
Finite element modeling of shear test on bumped Cu-low K wafers
Publication:
Finite element modeling of shear test on bumped Cu-low K wafers
Copy permalink
Date
2003
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degryse, Dominiek
;
Labie, Riet
;
Vandevelde, Bart
;
Beyne, Eric
Journal
Abstract
Description
Metrics
Views
1994
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1994
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-10
Citations