Publication:
Accessing electronic properties of two-dimensional materials with gate-dependent micro four-point probe
| dc.contributor.author | Introna, Marco | |
| dc.contributor.author | Bogdanowicz, Janusz | |
| dc.contributor.author | Silva, Henry Medina | |
| dc.contributor.author | Banerjee, Sreetama | |
| dc.contributor.author | Kalhauge, Kristoffer G. | |
| dc.contributor.author | Wouters, Lennaert | |
| dc.contributor.author | Shi, Yuanyuan | |
| dc.contributor.author | Kim, Ju-Seok | |
| dc.contributor.author | Lin, Dennis | |
| dc.contributor.author | Asselberghs, Inge | |
| dc.contributor.author | Adelmann, Christoph | |
| dc.contributor.author | Afanas'Ev, Valeri V. | |
| dc.contributor.author | Zandvliet, Harold J. W. | |
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.imecauthor | Introna, Marco | |
| dc.contributor.imecauthor | Bogdanowicz, Janusz | |
| dc.contributor.imecauthor | Silva, Henry Medina | |
| dc.contributor.imecauthor | Banerjee, Sreetama | |
| dc.contributor.imecauthor | Wouters, Lennaert | |
| dc.contributor.imecauthor | Kim, Ju-Seok | |
| dc.contributor.imecauthor | Lin, Dennis | |
| dc.contributor.imecauthor | Asselberghs, Inge | |
| dc.contributor.imecauthor | Adelmann, Christoph | |
| dc.contributor.imecauthor | Afanas'Ev, Valeri V. | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.orcidimec | Introna, Marco::0000-0002-5270-1015 | |
| dc.contributor.orcidimec | Bogdanowicz, Janusz::0000-0002-7503-8922 | |
| dc.contributor.orcidimec | Banerjee, Sreetama::0000-0002-6297-9547 | |
| dc.contributor.orcidimec | Wouters, Lennaert::0000-0002-6730-9542 | |
| dc.contributor.orcidimec | Lin, Dennis::0000-0002-1577-6050 | |
| dc.contributor.orcidimec | Asselberghs, Inge::0000-0001-8371-3222 | |
| dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.date.accessioned | 2024-12-17T17:17:05Z | |
| dc.date.available | 2024-12-17T17:17:05Z | |
| dc.date.issued | 2025-JAN 1 | |
| dc.identifier.doi | 10.1088/2053-1583/ad9843 | |
| dc.identifier.issn | 2053-1583 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44988 | |
| dc.publisher | IOP Publishing Ltd | |
| dc.source.issue | 1 | |
| dc.source.journal | 2D MATERIALS | |
| dc.source.numberofpages | 9 | |
| dc.source.volume | 12 | |
| dc.subject.keywords | GRAPHENE | |
| dc.title | Accessing electronic properties of two-dimensional materials with gate-dependent micro four-point probe | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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