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Inelastic Background Analysis of Novel Laboratory-Based HAXPES Spectra

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dc.contributor.authorZborowski, Charlotte
dc.contributor.authorConard, Thierry
dc.contributor.authorVanleenhove, Anja
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorFlavell, Wendy
dc.contributor.authorSpencer, Ben
dc.contributor.imecauthorZborowski, Charlotte
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVanleenhove, Anja
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.accessioned2021-10-28T00:33:27Z
dc.date.available2021-10-28T00:33:27Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34525
dc.source.conference8th International Conference on Hard X-ray Photoelectron Spectroscopy HAXPES2019
dc.source.conferencedate2/06/2019
dc.source.conferencelocationParis France
dc.title

Inelastic Background Analysis of Novel Laboratory-Based HAXPES Spectra

dc.typeMeeting abstract
dspace.entity.typePublication
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