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Bias Temperature Instabilities in MOSFETs with High-k Dielectrics
Publication:
Bias Temperature Instabilities in MOSFETs with High-k Dielectrics
Date
2010
Book
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Aoulaiche, Marc
;
Groeseneken, Guido
;
Maes, Herman
Journal
Abstract
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2112
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
2112
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations