Publication:
On the hot-hole induced post-stress interface trap generation in MOSFETs
Date
| dc.contributor.author | Al-Kofahi, I. S. | |
| dc.contributor.author | Zhang, Jenny | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-09-29T14:15:56Z | |
| dc.date.available | 2021-09-29T14:15:56Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1052 | |
| dc.source.beginpage | 305 | |
| dc.source.conference | 1996 International Reliability Physics Proceedings ; April 29 - May 2, 1996. Dallas, Texas, USA. | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 310 | |
| dc.title | On the hot-hole induced post-stress interface trap generation in MOSFETs | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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