Publication:
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
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1967 since deposited on 2021-10-22
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Acq. date: 2026-03-17
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Statistics
Views
1967 since deposited on 2021-10-22
1last month
1last week
Acq. date: 2026-03-17
Citations