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DIBL study using trible gate unstrained and uniaxial/biaxial strained FinFETs
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DIBL study using trible gate unstrained and uniaxial/biaxial strained FinFETs
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Date
2009
Proceedings Paper
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19273.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Santos, S.D.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
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1844
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations
Metrics
Views
1844
since deposited on 2021-10-18
Acq. date: 2025-12-15
Citations