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Mobility degradation in high-k transistors: the role of the charge scattering
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Mobility degradation in high-k transistors: the role of the charge scattering
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lujan, Guilherme
;
Kubicek, Stefan
;
De Gendt, Stefan
;
Heyns, Marc
;
Magnus, Wim
;
De Meyer, Kristin
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1877
since deposited on 2021-10-15
4
last month
Acq. date: 2025-12-10
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Metrics
Views
1877
since deposited on 2021-10-15
4
last month
Acq. date: 2025-12-10
Citations