Low frequency noise analysis for post-treatment of replacement metal gate FinFET

Simple item page Full metadata Statistics

Author(s)

;

;

Veloso, Anabela

;

;

Arimura, Hiroaki

;

Boccardi, Guillaume

;

Ragnarsson, Lars-Ake

;

Chiarella, Thomas

;

Horiguchi, Naoto

;

;

Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Metrics

1945 since deposited on 2021-10-21

Acq. date: 2025-10-23