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Attenuated phase shifting masks in combination with off-axis illumination: A way towards quarter micron DUV lithography for random logic operations
Publication:
Attenuated phase shifting masks in combination with off-axis illumination: A way towards quarter micron DUV lithography for random logic operations
Date
1994
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ronse, Kurt
;
Pforr, Rainer
;
Baik, Ki-Ho
;
Jonckheere, Rik
;
Van den hove, Luc
Journal
Microelectronic Engineering
Abstract
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2137
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2137
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations