Publication:
Advanced experimental techniques for BTI characterization (tutorial)
Date
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-20T11:59:54Z | |
| dc.date.available | 2021-10-20T11:59:54Z | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20887 | |
| dc.source.conference | ON Semiconductor | |
| dc.source.conferencedate | 13/06/2012 | |
| dc.source.conferencelocation | Oudenaarde Belgium | |
| dc.title | Advanced experimental techniques for BTI characterization (tutorial) | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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