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Interfacial reactions and phase stabilization of doped hafnia and higher-k oxides: the added value of GATR-FTIR

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dc.contributor.authorHardy, An
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorFavia, Paola
dc.contributor.authorBender, Hugo
dc.contributor.authorFranquet, Alexis
dc.contributor.authorVan den Rul, Heidi
dc.contributor.authorVan Bael, Marlies
dc.contributor.authorD'Haen, Jan
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorD'Olieslaeger, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorKittl, Jorge
dc.contributor.authorDetavernier, Christophe
dc.contributor.authorMullens, Jules
dc.contributor.imecauthorHardy, An
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorVan Bael, Marlies
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorD'Olieslaeger, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecVan Bael, Marlies::0000-0002-5516-7962
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.contributor.orcidimecHardy, An::0000-0002-5012-0356
dc.contributor.orcidimecD'Olieslaeger, Marc::0000-0001-7951-8037
dc.date.accessioned2021-10-17T22:44:29Z
dc.date.available2021-10-17T22:44:29Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15440
dc.source.conferenceMRS Spring Meeting Symposium C: CMOS Gate-Stack Scaling - Materials, Interfaces, and Reliability Implications
dc.source.conferencedate14/04/2009
dc.source.conferencelocationSan Francisco, CA US
dc.title

Interfacial reactions and phase stabilization of doped hafnia and higher-k oxides: the added value of GATR-FTIR

dc.typeOral presentation
dspace.entity.typePublication
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