Publication:

Characterization and simulation methodology for time-dependent variability in advanced technologies

Date

2015
Proceedings Paper
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dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSimicic, Marko
dc.contributor.authorRoussel, Philippe
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.contributor.authorVerkest, Diederik
dc.contributor.authorCatthoor, Francky
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-23T00:57:33Z
dc.date.available2021-10-23T00:57:33Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26170
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7338379
dc.source.beginpage1
dc.source.conferenceIEEE Custom Integrated Circuits Conference - CICC
dc.source.conferencedate28/09/2015
dc.source.conferencelocationSan Jose, CA USA
dc.source.endpage8
dc.title

Characterization and simulation methodology for time-dependent variability in advanced technologies

dc.typeProceedings paper
dspace.entity.typePublication
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