Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Wafer thermal desorption spectrometry in a rapid thermal processor using atmospheric pressure ionization mass spectrometry
Publication:
Wafer thermal desorption spectrometry in a rapid thermal processor using atmospheric pressure ionization mass spectrometry
Date
2000
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
4911.pdf
118.44 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vereecke, Guy
;
Kondoh, Eiichi
;
Richardson, Paul
;
Maex, Karen
;
Heyns, Marc
Journal
IEEE Trans. Semiconductor Processing
Abstract
Description
Metrics
Views
1989
since deposited on 2021-10-14
427
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1989
since deposited on 2021-10-14
427
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations