Publication:

Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control

Date

2022
Proceedings Paper
https://doi.org/10.1109/ICICDT56182.2022.9933087
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dc.contributor.authorSubhechha, Subhali
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorHody, Hubert
dc.contributor.authorDekkers, Harold
dc.contributor.authorvan Setten, Michiel
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorHoushmand Sharifi, Shamin
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorPuliyalil, Harinarayanan
dc.contributor.authorKundu, Souvik
dc.contributor.authorPak, Murat
dc.contributor.authorTsvetanova, Diana
dc.contributor.authorBazzazian, Nina
dc.contributor.authorVandersmissen, Kevin
dc.contributor.authorBatuk, Dmitry
dc.contributor.authorGeypen, Jef
dc.contributor.authorHeijlen, Jeroen
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorSubhechha, Subhali
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorHody, Hubert
dc.contributor.imecauthorDekkers, Harold
dc.contributor.imecauthorvan Setten, Michiel
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorHoushmand Sharifi, Shamin
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorPuliyalil, Harinarayanan
dc.contributor.imecauthorKundu, Souvik
dc.contributor.imecauthorPak, Murat
dc.contributor.imecauthorTsvetanova, Diana
dc.contributor.imecauthorBazzazian, Nina
dc.contributor.imecauthorVandersmissen, Kevin
dc.contributor.imecauthorBatuk, Dmitry
dc.contributor.imecauthorGeypen, Jef
dc.contributor.imecauthorHeijlen, Jeroen
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecSubhechha, Subhali::0000-0002-1960-5136
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.contributor.orcidimecvan Setten, Michiel::0000-0003-0557-5260
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecPuliyalil, Harinarayanan::0000-0002-9749-5307
dc.contributor.orcidimecTsvetanova, Diana::0000-0002-5632-5539
dc.contributor.orcidimecBatuk, Dmitry::0000-0002-6384-6690
dc.date.accessioned2023-04-28T09:27:50Z
dc.date.available2023-03-25T03:50:43Z
dc.date.available2023-04-28T09:27:50Z
dc.date.issued2022
dc.identifier.doi10.1109/ICICDT56182.2022.9933087
dc.identifier.eisbn978-1-6654-5901-3
dc.identifier.issn2381-3555
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41363
dc.publisherIEEE
dc.source.beginpage88
dc.source.conferenceInternational Conference on IC Design and Technology (ICICDT)
dc.source.conferencedateSEP 21-23, 2022
dc.source.conferencelocationHanoi
dc.source.endpage88
dc.source.journalna
dc.source.numberofpages1
dc.title

Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control

dc.typeProceedings paper
dspace.entity.typePublication
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