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Optical characterisation of silicon wafers with and without a back surface reflector
Publication:
Optical characterisation of silicon wafers with and without a back surface reflector
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Date
1998
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hanselaer, P.
;
Van den Abeele, A.
;
Forment, S.
;
Frisson, Louis
;
Poortmans, Jef
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1892
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations
Metrics
Views
1892
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations