Publication:

Comparative reliability investigation of different nitride based local charge trapping memory devices

Date

2005
Proceedings Paper
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dc.contributor.authorBreuil, Laurent
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorBlomme, Pieter
dc.contributor.authorLorenzini, Martino
dc.contributor.authorWellekens, Dirk
dc.contributor.authorDe Vos, Joeri
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorDe Vos, Joeri
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecDe Vos, Joeri::0000-0002-9332-9336
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-16T00:50:08Z
dc.date.available2021-10-16T00:50:08Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10150
dc.source.beginpage181
dc.source.conferenceProceedings 43rd Annual International Reliability Physics Symposium
dc.source.conferencedate17/04/2005
dc.source.conferencelocationSan Jose, CA USA
dc.source.endpage185
dc.title

Comparative reliability investigation of different nitride based local charge trapping memory devices

dc.typeProceedings paper
dspace.entity.typePublication
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