Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning
Publication:
Nondestructive internal quality inspection of pear fruit by X-ray CT using machine learning
Date
2020
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van De Looverbosch, Tim
;
Bhuiyan, Md Hafizur Rahman
;
Verboven, Pieter
;
Dierick, Manuel
;
Van Loo, Denis
;
De Beenhouwer, Jan
;
Sijbers, Jan
;
Nicolai, Bart
Journal
Food Control
Abstract
Description
Metrics
Views
1917
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations
Metrics
Views
1917
since deposited on 2021-10-29
Acq. date: 2025-10-25
Citations