Publication:
Impact of a high electric field on the extraction of the generation lifetime from the reverse generation current component of shallow n+-p-well diodes
Date
| dc.contributor.author | Poyai, Amporn | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T17:37:43Z | |
| dc.date.available | 2021-10-14T17:37:43Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5586 | |
| dc.source.beginpage | 2445 | |
| dc.source.endpage | 2446 | |
| dc.source.issue | 10 | |
| dc.source.journal | IEEE Trans. Electron Devices | |
| dc.source.volume | 48 | |
| dc.title | Impact of a high electric field on the extraction of the generation lifetime from the reverse generation current component of shallow n+-p-well diodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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