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The low-frequency noise behaviour of different SOI CMOS technologies

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dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T12:47:30Z
dc.date.available2021-09-29T12:47:30Z
dc.date.embargo9999-12-31
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/348
dc.source.beginpage779
dc.source.conference24th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/1994
dc.source.conferencelocationEdinburgh UK
dc.source.endpage782
dc.title

The low-frequency noise behaviour of different SOI CMOS technologies

dc.typeProceedings paper
dspace.entity.typePublication
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