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Bias temperature instability analysis of FinFET based SRAM cells
Publication:
Bias temperature instability analysis of FinFET based SRAM cells
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Date
2014
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Khan, Seyab
;
Agbo, Innocent
;
Hamdioui, Said
;
Kukner, Halil
;
Kaczer, Ben
;
Raghavan, Praveen
;
Catthoor, Francky
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1967
since deposited on 2021-10-22
3
last month
Acq. date: 2025-12-12
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Metrics
Views
1967
since deposited on 2021-10-22
3
last month
Acq. date: 2025-12-12
Citations