Publication:
Electrical defect study in thin-film SiGe/Si solar cells
Date
| dc.contributor.author | Daami, A. | |
| dc.contributor.author | Zerrai, A. | |
| dc.contributor.author | Marchand, J. J. | |
| dc.contributor.author | Poortmans, Jef | |
| dc.contributor.author | Bremond, G. | |
| dc.contributor.imecauthor | Poortmans, Jef | |
| dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
| dc.date.accessioned | 2021-10-14T16:44:33Z | |
| dc.date.available | 2021-10-14T16:44:33Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5178 | |
| dc.source.beginpage | 331 | |
| dc.source.endpage | 334 | |
| dc.source.issue | 1_3 | |
| dc.source.journal | Materials Science in Semiconductor Processing | |
| dc.source.volume | 4 | |
| dc.title | Electrical defect study in thin-film SiGe/Si solar cells | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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