Publication:
Fine lines between success and failure
Date
| dc.contributor.author | Kinkead, D. A. | |
| dc.contributor.author | Ercken, Monique | |
| dc.contributor.imecauthor | Ercken, Monique | |
| dc.date.accessioned | 2021-10-14T13:08:44Z | |
| dc.date.available | 2021-10-14T13:08:44Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4470 | |
| dc.source.beginpage | 19 | |
| dc.source.issue | May | |
| dc.source.journal | European Semiconductor | |
| dc.source.volume | 22 | |
| dc.title | Fine lines between success and failure | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |