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Atomic-Scale Characterization of Structure and Defects in Synthetic 2D Layered Chalcogenides

Date

2020-09-20
Dissertation
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cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0002-2169-940X
cris.virtualsource.departmente40ffda2-4d5d-4450-83e2-8f9eb0120908
cris.virtualsource.orcide40ffda2-4d5d-4450-83e2-8f9eb0120908
dc.contributor.advisorVandervorst, Wilfried
dc.contributor.advisorBender, Hugo
dc.contributor.authorNalin Mehta, Ankit
dc.date.accessioned2026-04-29T13:07:40Z
dc.date.available2026-04-29T13:07:40Z
dc.date.issued2020-09-20
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59232
dc.provenance.editstepusermeghan.oneill@imec.be
dc.title

Atomic-Scale Characterization of Structure and Defects in Synthetic 2D Layered Chalcogenides

dc.typePHD thesis
dspace.entity.typePublication
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