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Evidence of TiOx reduction at the SiOx/TiOx interface of passivating electron-selective contacts
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Evidence of TiOx reduction at the SiOx/TiOx interface of passivating electron-selective contacts
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Date
2018
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Jinyoun
;
Debucquoy, Maarten
;
Recaman Payo, Maria
;
Schapmans, Elie
;
Gordon, Ivan
;
Szlufcik, Jozef
;
Poortmans, Jef
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1930
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Acq. date: 2025-12-12
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Views
1930
since deposited on 2021-10-25
1
last month
Acq. date: 2025-12-12
Citations