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Evidence of TiOx reduction at the SiOx/TiOx interface of passivating electron-selective contacts
Publication:
Evidence of TiOx reduction at the SiOx/TiOx interface of passivating electron-selective contacts
Date
2018
Proceedings Paper
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38933.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cho, Jinyoun
;
Debucquoy, Maarten
;
Recaman Payo, Maria
;
Schapmans, Elie
;
Gordon, Ivan
;
Szlufcik, Jozef
;
Poortmans, Jef
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1928
since deposited on 2021-10-25
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Acq. date: 2025-10-24
Citations
Metrics
Views
1928
since deposited on 2021-10-25
438
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations