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Simulations of bias temperature instabilities in p-MOSFETs with HfySiOx-based gate dielectrics
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1889 since deposited on 2021-10-15
2last month
Acq. date: 2025-12-15
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Views
1889 since deposited on 2021-10-15
2last month
Acq. date: 2025-12-15
Citations