Publication:
Simulations of bias temperature instabilities in p-MOSFETs with HfySiOx-based gate dielectrics
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1890 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-30
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Statistics
Views
1890 since deposited on 2021-10-15
1last month
Acq. date: 2026-04-30
Citations