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Conference contributions
Resilience in all-optical label switching networks: a node dimensioning point of view
Publication:
Resilience in all-optical label switching networks: a node dimensioning point of view
Date
2005-11
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Caenegem, Ruth
;
Colle, Didier
;
Pickavet, Mario
;
Demeester, Piet
Journal
Abstract
Description
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1880
since deposited on 2021-10-16
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1880
since deposited on 2021-10-16
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations