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Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETs
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Impact of strain and strain-relaxation on the low-frequency noise of SRB silicon n-MOSFETs
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Claeys, Cor
;
Verheyen, Peter
;
Delhougne, Romain
;
Loo, Roger
;
De Meyer, Kristin
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1803
since deposited on 2021-10-16
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Acq. date: 2025-12-15
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Metrics
Views
1803
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-15
Citations