Publication:

Subthreshold region analysis for UTBOX and UTBB SOI nMOSFETs with different channel lengths and silicon thickness

Date

2017
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorSilva, V.C.P.
dc.contributor.authorSonnenberg, V.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorAgopian, P.G.D.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-24T13:32:22Z
dc.date.available2021-10-24T13:32:22Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29436
dc.source.beginpage1
dc.source.conference32nd Symposium on Microelectronics Technology and Devices - SBMicro
dc.source.conferencedate28/08/2017
dc.source.conferencelocationFortaleza Brazil
dc.source.endpage4
dc.title

Subthreshold region analysis for UTBOX and UTBB SOI nMOSFETs with different channel lengths and silicon thickness

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
38935.pdf
Size:
299.92 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions