Publication:

Annealing stability of magnetic tunnel junctions no dual MgO free layers and Co/Ni based synthetic antiferromagnetic reference system

Date

2017
Journal article
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dc.contributor.authorDevolder, Thibaut
dc.contributor.authorCouet, Sebastien
dc.contributor.authorSwerts, Johan
dc.contributor.authorLiu, Enlong
dc.contributor.authorLin, Tsann
dc.contributor.authorMertens, Sofie
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorFurnemont, Arnaud
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.date.accessioned2021-10-24T04:14:22Z
dc.date.available2021-10-24T04:14:22Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28231
dc.identifier.urlhttp://aip.scitation.org/doi/full/10.1063/1.4978633
dc.source.beginpage113904
dc.source.issue11
dc.source.journalJournal of Applied Physics
dc.source.volume121
dc.title

Annealing stability of magnetic tunnel junctions no dual MgO free layers and Co/Ni based synthetic antiferromagnetic reference system

dc.typeJournal article
dspace.entity.typePublication
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